Semiconductor Inspection Servicesのメーカーや取扱い企業、製品情報、参考価格、ランキングをまとめています。
イプロスは、 製造業 ・ BtoB における情報を集めた国内最大級の技術データベースサイトです。

Semiconductor Inspection Services - メーカー・企業と業務用製品 | イプロスものづくり

Semiconductor Inspection Servicesの製品一覧

1~2 件を表示 / 全 2 件

表示件数

Semiconductor inspection (wafer test) services

Leave electrical characteristic testing, laser trimming, reliability testing, and more to us!

Our company conducts electrical characteristic testing, laser trimming, and visual inspection as part of semiconductor testing (wafer testing), as well as reliability testing. In addition, we offer test development, equipment modifications, and production capacity improvements based on customer requests. We can flexibly respond to the construction of testing methods, development of test programs, and development of test boards and probe cards according to product specifications and test specifications. Furthermore, our cleanroom has an effective cleanliness level of "Class 10," allowing us to conduct tests on products, particularly semiconductors, that are significantly affected by foreign matter contamination. *For more details, please feel free to contact us.

  • Other semiconductors
  • Semiconductor inspection/test equipment
  • Semiconductor Inspection Services

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録

Proposal for Semiconductor Inspection (Wafer Test) Services

We provide support from reliability testing to failure analysis reports!

Rinjin Tech provides semiconductor inspection (wafer testing) services. As part of quality control for automotive products, we offer technologies such as OST (Outliers Screening Test) to detect outlier chips from wafer test results and classify them as defective, in order to further improve the quality of good chips. Additionally, we have services for electrostatic management, earthquake countermeasures, and reliability testing. 【Wafer Testing Technologies】 ■PAT (Part Average Testing) - Purpose: To calculate the distribution of measurement values for individual test items and classify chips with data that deviates from the main distribution as defective. ■GAT (Geometric Analysis Testing) - Purpose: To detect chips that deviate from the good product distribution based on the positional distribution on the wafer from the map data of test results and classify them as defective. *For more details, please refer to the PDF document or feel free to contact us.

  • Other semiconductors
  • Semiconductor inspection/test equipment
  • Semiconductor Inspection Services

ブックマークに追加いたしました

ブックマーク一覧

ブックマークを削除いたしました

ブックマーク一覧

これ以上ブックマークできません

会員登録すると、ブックマークできる件数が増えて、ラベルをつけて整理することもできます

無料会員登録